regulus 8100 cryogenic scanning electron microscope Search Results


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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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scanning electron microscope  (Carl Zeiss)
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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scanning electron microscope zeiss gemini 300  (Carl Zeiss)
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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<t>SEM</t> images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); <t>TEM</t> images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).
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Image Search Results


SEM images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); TEM images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).

Journal: Molecules : A Journal of Synthetic Chemistry and Natural Product Chemistry

Article Title: SiO 2 Stabilized Magnetic Nanoparticles as a Highly Effective Catalyst for the Degradation of Basic Fuchsin in Industrial Dye Wastewaters

doi: 10.3390/molecules23102573

Figure Lengend Snippet: SEM images of Fe 3 O 4 MNPs ( A ) and Fe 3 O 4 @SiO 2 MNPs ( B ); TEM images of Fe 3 O 4 ( C ) and Fe 3 O 4 @SiO 2 ( D ).

Article Snippet: Instrumentation: Scanning electron microscope (SEM) (JEM-3010, Shimadzu Corporation, Tokyo, Japan); Transmission electron microscopy (TEM) (Hitachi-8100, Japan JEOL Corporation, Tokyo, Japan); X-ray powder diffraction (XRD) (MAX-2500, Neo-Confucianism Japanese Company, Tokyo, Japan); UV-Vis Spectrophotometer (TU-1901, Beijing Purkinje General Instrument Co., Ltd., Beijing, China); Vibrating sample magnetometer (VSM) (Lake Shore VSM 7307, Lake Shore Company, Washington, MI, USA); Infrared spectrometer (FT-IR) (Avatar 360, Thermo Nicolet Corporation, Madison, WI, USA); Ultrasonic cleaner (KQ-50B, Kunshan Ultrasonic Instruments Co., Ltd, Kunshan, China); pH meter (Kunshan Ultrasonic Instruments Co., Ltd.).

Techniques: